Structural and Elastic Properties of Zirconium Nitride-Aluminum Nitride Multilayers

Kathryn A. Svinarich, G. L. Eesley, W. J. Meng

Research output: Contribution to journalArticlepeer-review

Abstract

We have synthesized a series of zirconium nitride–aluminum nitride multilayers with a reactive sputtering technique. Structure and elastic response of these multilayers are characterized by x-ray-diffraction and transient piezoreflectance measurements. We observe a systematic decrease of the longitudinal elastic response in the direction of film growth as the composition modulation wavelength decreases. This contradicts a recent model of elastic response which predicts the absence of elastic anomaly in metal-insulator multilayers.
Original languageAmerican English
JournalPhysical Review B
DOIs
StatePublished - Sep 1 1990

Keywords

  • elastic properties of zirconium
  • nitride aluminum multilayers
  • reactive sputtering
  • elastic anomaly
  • metal-insulator multilayers

Disciplines

  • Condensed Matter Physics

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