Abstract
We have synthesized a series of zirconium nitride–aluminum nitride multilayers with a reactive sputtering technique. Structure and elastic response of these multilayers are characterized by x-ray-diffraction and transient piezoreflectance measurements. We observe a systematic decrease of the longitudinal elastic response in the direction of film growth as the composition modulation wavelength decreases. This contradicts a recent model of elastic response which predicts the absence of elastic anomaly in metal-insulator multilayers.
Original language | American English |
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Journal | Physical Review B |
DOIs | |
State | Published - Sep 1 1990 |
Keywords
- elastic properties of zirconium
- nitride aluminum multilayers
- reactive sputtering
- elastic anomaly
- metal-insulator multilayers
Disciplines
- Condensed Matter Physics