Characterization of the Deposition Behavior and Changes in Bonding Structures of Hexamethyldisiloxane and Decamethylcyclopentasiloxane Atmospheric Plasma‐Deposited Films

Mary Gilliam, Susan Farhat, Graham Garner, Barrack Stubbs, Benjamin Peterson

Research output: Contribution to journalArticlepeer-review

Abstract

<p> The plasma deposition behavior of hexamethyldisiloxane (HMDSO) and decamethylcyclopentasiloxane (D5) is investigated for an atmospheric pressure plasma jet. The energy&hyphen;deficient and monomer&hyphen;deficient domains are revealed by normalized parameters and no significant difference between HMDSO and D5 is observed. The results are supported by Fourier&hyphen;transform infrared spectroscopy (FTIR) and X&hyphen;ray photoelectron spectroscopy. The data is also evaluated using an Arrhenius&hyphen;type equation and an empirical equation reported in the literature, but the correlation is not as good as the normalized parameters. Changes in Si&ndash;O&ndash;Si bonding arrangements are analyzed by deconvolution of the FTIR absorbance band, showing an increase in porous cage structures with higher normalized energy input.</p>
Original languageAmerican English
JournalPlasma Processes Polymers
Volume16
DOIs
StatePublished - Apr 12 2019

Keywords

  • Deposition Characterization
  • Infrared Spectroscopy
  • Organosilicon Precursors
  • Plasma Polymerization
  • Plasma‐Enhanced Chemical Vapor Deposition

Disciplines

  • Chemical Engineering
  • Engineering

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