Back diffusion of electrons in N2 subjected to crossed fields

M. S. Dincer, Huseyin R. Hiziroglu

Research output: Contribution to conferencePresentation

Abstract

In the E/N range of 50 Td - 700 Td (1 Td = 10 -21 Vm 2 ), the back diffusion process for nitrogen subjected to crossed fields are investigated at B/N values ranging from 0 to 24.24 × 10 -25 Tm 3 by means of a Monte Carlo technique employing realistic collision cross sections. It is observed that at constant electron emission energy of 1.0 eV, for a given E/N the escape factor decreases as B/N increases. It is also observed that in the lower E/N range in crossed fields the escape factor is smaller than those of the higher E/N range. The escape factor on the magnetic deflection angle is evaluated and a dependence on the magnetic field is observed in crossed fields in the given ranges of E/N and B/N.

Original languageAmerican English
StatePublished - Oct 18 2015
EventIEEE Xplore -
Duration: May 24 2016 → …

Conference

ConferenceIEEE Xplore
Period5/24/16 → …

Disciplines

  • Electrical and Computer Engineering

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